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242 lines (183 loc) · 9.38 KB
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from jtaghex import DataSerializer
import bsdl
import svf
class BsdlSemantics:
def map_string(self, ast):
parser = bsdl.bsdlParser()
ast = parser.parse(''.join(ast), "port_map")
return ast
def grouped_port_identification(self, ast):
parser = bsdl.bsdlParser()
ast = parser.parse(''.join(ast), "group_table")
return ast
class TestGenerator:
def __init__(self, bsdlfile, pins):
parser = bsdl.bsdlParser()
self.bsd_data = parser.parse(open(bsdlfile).read(), "bsdl_description", semantics=BsdlSemantics(), parseinfo=False)
self.dr_scan_len = int(self.bsd_data["boundary_scan_register_description"]["fixed_boundary_stmts"]["boundary_length"])
self.ir_scan_len = int(self.bsd_data["instruction_register_description"]["instruction_length"])
led_a_pin = "IO64"
led_b_pin = "IO48"
pos_out_led_green = self.get_pin_pos(led_a_pin, "OUTPUT3")
pos_out_led_yellow = self.get_pin_pos(led_b_pin, "OUTPUT3")
self.fill_instructions()
print(self.instructions)
self.testpins = pins
self.sample = DataSerializer()
self.sample.add_data_block(self.ir_scan_len, self.instructions["SAMPLE"])
self.sample.add_data_block(self.ir_scan_len, self.instructions["SAMPLE"])
self.extest = DataSerializer()
self.extest.add_data_block(self.ir_scan_len, self.instructions["EXTEST"])
self.extest.add_data_block(self.ir_scan_len, self.instructions["EXTEST"])
self.testdata = DataSerializer()
self.result_mask = DataSerializer()
self.expected_result = DataSerializer()
self.testcon = DataSerializer()
self.testcon.add_data_block(self.ir_scan_len, self.instructions["SAMPLE"])
self.testcon.add_data_block(self.ir_scan_len, self.instructions["EXTEST"])
self.led_green_on = DataSerializer()
self.led_green_on.add_data_block(self.dr_scan_len, 0)
self.led_green_on.add_data_block(self.dr_scan_len, 1 << pos_out_led_green)
def simple_bridge_test(self):
self.testdata.clear()
#second device will measure -> no data
self.testdata.add_data_block(self.dr_scan_len, 0)
#first device sets outputs
self.testdata.add_data_block(self.dr_scan_len, 1 << self.get_pin_pos("IO56", "OUTPUT3"))
self.result_mask.clear()
self.result_mask.add_data_block(self.dr_scan_len, 1 << self.get_pin_pos("IO49", "INPUT") | 1 << self.get_pin_pos("IO50", "INPUT"))
self.result_mask.add_data_block(self.dr_scan_len, 0)
self.expected_result.clear()
self.expected_result.add_data_block(self.dr_scan_len, 1 << self.get_pin_pos("IO49", "INPUT"))
self.expected_result.add_data_block(self.dr_scan_len, 0)
svf_writer = svf.SVFWriter()
svf_writer.rst_state()
svf_writer.frequency(10000000)
#set test data
svf_writer.send_instruction(self.sample.get_len(), self.sample.get_hex_str())
svf_writer.send_data(self.testdata.get_len(), self.testdata.get_hex_str())
svf_writer.send_instruction(self.testcon.get_len(), self.testcon.get_hex_str())
svf_writer.do_data_test(self.expected_result.get_len(), self.expected_result.get_hex_str(), self.result_mask.get_hex_str())
#if we get here the test did not fail
svf_writer.send_data(self.led_green_on.get_len(), self.led_green_on.get_hex_str())
svf_writer.send_instruction(self.extest.get_len(), self.extest.get_hex_str())
svf_writer.write_to_file("simple_bridge_test.svf")
def pull_up_test_all(self):
svf_writer = svf.SVFWriter()
svf_writer.rst_state()
svf_writer.frequency(10000000)
self.testdata.clear()
self.result_mask.clear()
self.expected_result.clear()
#no weird gates -> so no fancy testing required -> all in parallel possible
#pull up test checks if a high is recieved while all data is zero
self.testdata.add_data_block(self.dr_scan_len, 0)
self.testdata.add_data_block(self.dr_scan_len, 0)
#expecting all zero answer
self.expected_result.add_data_block(self.dr_scan_len, 0)
self.expected_result.add_data_block(self.dr_scan_len, 0)
#mask all input cells of recieving chip
mask = 0
for i in range(len(self.testpins)):
mask = mask | (1 << self.get_pin_pos(self.testpins[i], "INPUT"))
self.result_mask.add_data_block(self.dr_scan_len, mask)
self.result_mask.add_data_block(self.dr_scan_len, 0)
#write test sequence
svf_writer.send_instruction(self.sample.get_len(), self.sample.get_hex_str())
svf_writer.send_data(self.testdata.get_len(), self.testdata.get_hex_str())
svf_writer.send_instruction(self.testcon.get_len(), self.testcon.get_hex_str())
svf_writer.do_data_test(self.expected_result.get_len(), self.expected_result.get_hex_str(), self.result_mask.get_hex_str())
#if we get here the test did not fail
svf_writer.send_data(self.led_green_on.get_len(), self.led_green_on.get_hex_str())
svf_writer.send_instruction(self.extest.get_len(), self.extest.get_hex_str())
svf_writer.write_to_file("pull_up_test_all.svf")
def pull_down_test_all(self):
svf_writer = svf.SVFWriter()
svf_writer.rst_state()
svf_writer.frequency(10000000)
self.testdata.clear()
self.result_mask.clear()
self.expected_result.clear()
#mask all input cells of recieving chip
mask = 0
result = 0
testpattern = 0
for i in range(len(self.testpins)):
mask = mask | (1 << self.get_pin_pos(self.testpins[i], "INPUT"))
result = result | (1 << self.get_pin_pos(self.testpins[i], "INPUT"))
testpattern = testpattern | (1 << self.get_pin_pos(self.testpins[i], "OUTPUT3"))
#no weird gates -> so no fancy testing required -> all in parallel possible
#pull up test checks if a high is recieved while all data is zero
self.testdata.add_data_block(self.dr_scan_len, 0)
#first chips pulls pins high
self.testdata.add_data_block(self.dr_scan_len, testpattern)
#expecting all zero answer
self.expected_result.add_data_block(self.dr_scan_len, result)
self.expected_result.add_data_block(self.dr_scan_len, 0)
self.result_mask.add_data_block(self.dr_scan_len, mask)
self.result_mask.add_data_block(self.dr_scan_len, 0)
#write test sequence
svf_writer.send_instruction(self.sample.get_len(), self.sample.get_hex_str())
svf_writer.send_data(self.testdata.get_len(), self.testdata.get_hex_str())
svf_writer.send_instruction(self.testcon.get_len(), self.testcon.get_hex_str())
svf_writer.do_data_test(self.expected_result.get_len(), self.expected_result.get_hex_str(), self.result_mask.get_hex_str())
#if we get here the test did not fail
svf_writer.send_data(self.led_green_on.get_len(), self.led_green_on.get_hex_str())
svf_writer.send_instruction(self.extest.get_len(), self.extest.get_hex_str())
svf_writer.write_to_file("pull_down_test_all.svf")
def short_test_all(self):
svf_writer = svf.SVFWriter()
svf_writer.rst_state()
svf_writer.frequency(10000000)
#mask all input cells of recieving chip
for i in range(len(self.testpins)):
print(self.testpins[i], self.testpins[len(self.testpins)-i-1])
self.testdata.clear()
self.result_mask.clear()
self.expected_result.clear()
mask = 0
result = 0
testpattern = 0
#test if highs are found at neighboring pins
if i == 0:
mask = mask | (1 << self.get_pin_pos(self.testpins[len(self.testpins)-1], "INPUT")) | (1 << self.get_pin_pos(self.testpins[len(self.testpins)-2], "INPUT"))
elif i == len(self.testpins)-1:
mask = mask | (1 << self.get_pin_pos(self.testpins[0], "INPUT")) | (1 << self.get_pin_pos(self.testpins[1], "INPUT"))
else:
for j in [-1, 0, 1]:
mask = mask | (1 << self.get_pin_pos(self.testpins[len(self.testpins)-(i+j)-1], "INPUT"))
#expecting high at only the expected recieving pin
result = result | (1 << self.get_pin_pos(self.testpins[len(self.testpins)-i-1], "INPUT"))
#test for shorts one pin at a time
testpattern = testpattern | (1 << self.get_pin_pos(self.testpins[i], "OUTPUT3"))
self.expected_result.add_data_block(self.dr_scan_len, result)
self.expected_result.add_data_block(self.dr_scan_len, 0)
self.testdata.add_data_block(self.dr_scan_len, 0)
#first chips pulls one pin high
self.testdata.add_data_block(self.dr_scan_len, testpattern)
self.result_mask.add_data_block(self.dr_scan_len, mask)
self.result_mask.add_data_block(self.dr_scan_len, 0)
#write test sequence
svf_writer.send_instruction(self.sample.get_len(), self.sample.get_hex_str())
svf_writer.send_data(self.testdata.get_len(), self.testdata.get_hex_str())
svf_writer.send_instruction(self.testcon.get_len(), self.testcon.get_hex_str())
svf_writer.do_data_test(self.expected_result.get_len(), self.expected_result.get_hex_str(), self.result_mask.get_hex_str())
#if we get here the test did not fail
svf_writer.send_data(self.led_green_on.get_len(), self.led_green_on.get_hex_str())
svf_writer.send_instruction(self.extest.get_len(), self.extest.get_hex_str())
svf_writer.write_to_file("short_test_all.svf")
def get_pin_pos(self, pin_name, cell_function):
for cell in self.bsd_data["boundary_scan_register_description"]["fixed_boundary_stmts"]["boundary_register"]:
if cell["cell_info"]["cell_spec"]["port_id"] == pin_name and cell["cell_info"]["cell_spec"]["function"] == cell_function:
return int(cell["cell_number"])
def fill_instructions(self):
self.instructions = {}
for i in self.bsd_data["instruction_register_description"]["instruction_opcodes"]:
self.instructions[i["instruction_name"]] = int(i["opcode_list"][0],2)
if __name__ == "__main__":
testpins = ["IO49", "IO50", "IO51", "IO52", "IO53", "IO54", "IO55", "IO56" ]
gen = TestGenerator("bsdlfiles/5M160ZE64.bsd", testpins)
gen.simple_bridge_test()
gen.pull_up_test_all()
gen.pull_down_test_all()
gen.short_test_all()