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Add two new terms to represent cryogenic variants of * scanning electron microscopy -> cryogenic scanning electron microscopy; * serial block face scanning electron microscopy -> cryogenic serial block face scanning electron microscopy. closes #35
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I've made a comment on #35 to clarify a bit better one of the terms; we can perhaps wait for other inputs there? |
Amend the definition of the newly added "cryogenic serial block face scanning electron microscopy" to remove the bit about the sectioning being done using a focused ion beam, so that the term can refer to cryo-SBF-SEM regardless of the sectioning technique used. Create two more child terms for * cryo-SBF-SEM when the sectioning is done using a focused ion beam; * cryo-SBF-SEM when the sectioning is done using a blade.
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Superseded by #40 |
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Add two new terms to represent cryogenic variants of
scanning electron microscopy -> cryogenic scanning electron microscopy;
serial block face scanning electron microscopy -> cryogenic serial block face scanning electron microscopy.
closes #35