Source code and dataset for the paper"Few-Shot Unseen Defect Segmentation for Polycrystalline Silicon Panels with An Interpretable Dual Subspace Attention Variational Learning Framework" in Advanced Engineering Informatics. https://www.sciencedirect.com/science/article/pii/S1474034624002611
System:
Method:
If you think this repo or dataset is useful, please cite our paper. Please note that the presented dataset is only available for academic research.
We are grateful for the implementation of the relevant methods used in this repository.
For any questions please contact:yhm22@mails.tsinghua.edu.cn(Mr.Yao), ywy@hust.edu.cn(Prof.Yu)