wafer-defect-detection

Here are 5 public repositories matching this topic...

gokularaman-c / wafer-defect-detection

Mask-aware wafer defect classification using a DenseNet-based CNN with explicit geometry masking and Grad-CAM explainability.

computer-vision deep-learning grad-cam cnn pytorch densenet explainable-ai semiconductor-manufacturing wafer-map wafer-defect-detection

Updated Jan 4, 2026
Jupyter Notebook

Rajendar-Muddasani-2 / ResNet_Wafer_Map_Classifier

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Enterprise-grade ML platform for semiconductor wafer defect classification using ResNet-50 U-Net architecture with active learning.

kubernetes enterprise machine-learning computer-vision deep-learning pytorch resnet production-ready semantic-segmentation active-learning semiconductor onnx fastapi wafer-defect-detection

Updated Mar 5, 2026
Python

PanagiotaGr / wafer-fault-detection-with-ml

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Research-driven wafer defect classification framework combining classical ML and CNN-based approaches, with experimental analysis of few-shot learning under severe class imbalance and limited data regimes.

machine-learning cnn classification class-imbalance semiconductor wafer focal-loss applied-machine-learning wafer-map ml-pipeline waf-detection wafer-defects manufacturing-ai wafer-defect-detection

Updated Jun 26, 2026
Jupyter Notebook

ALEX8642 / wafer-ssl

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SimCLR self-supervised pretraining on 638k unlabeled WM-811K wafer maps, plus multi-seed ensembling, extending wafer-defect-classifier.

computer-vision deep-learning pytorch image-classification ensemble-learning resnet representation-learning semiconductor self-supervised-learning simclr contrastive-learning wm-811k wafer-defect-detection

Updated Jul 2, 2026
Python

ALEX8642 / wafer-defect-classifier

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ResNet-18 wafer defect classifier trained on WM-811K — focal loss, CBAM attention, TTA, and Grad-CAM++ explainability. Macro-F1 0.916 on the 9-class labeled subset.

computer-vision deep-learning grad-cam pytorch image-classification resnet class-imbalance attention-mechanism semiconductor explainable-ai focal-loss wafer-map cbam test-time-augmentation supervised-classification defect-classification wm-811k manufacturing-ai wafer-defect-detection

Updated Jul 5, 2026
Python

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